Order Number
| Category
| Equipment
| Key Spec.
| Test Items
| CNAS
|
1
| Material Analyzer | Scanning Electron Microscopy (SEM) and Energy Spectrometer | SEM magnification: 16X～1,000,000X | Micro-area appearance analysis, composition analysis, micro-area size measurement |
|
High vacuum mode resolution: 3 nm @ 30 kV,8 nm @ 3 kV
|
Image size: up to 8,292 * 8,192 pixels
|
High vacuum mode: < 9×10-3 Pa
|
Available scope: 40mm(Length)×40mm(Width)×30mm(Height)
|
Energy spectrum analyzer resolution: Mn Kɑ＜129eV,100kcps
|
Energy spectrum analyzer range: B5～U92
|
Gold injector: the sample can be gilded
|
2
| X-ray Fluorescence | Element test scope: Na11~ U92； | Halogen-free test, element analysis, RoHS test, coating
|
|
Element analysis scope: 1ppm~99.99%
|
Simultaneous analysis: 24 elements
|
Testing time: 60s～200s
|
Tube voltage: 5KV～50KV,Tube current: 50uA～1000uA
|
Configure RoHS software to control the six harmful elements: Pb,Hg, Cd,Cr,Br,Cl
|
Configured Thick software to measure coatings: a minimum of 0.005um for analysis of coatings above 11 layers
|
3
| X-Ray Inspection System | Max. perspective area: 310mm × 310mm (2D) | Array detection (2D), SMT detection (2D), microfocus CT tomography analysis (3D)
|
|
Detailability: <1µm
|
Resolution max: 2008*2008；
Geometric magnification: Max. 1260X |
| FGUI software（2D),VG software（3D) |
4
| Semi-automatic grinding and polishing machine | Rotor speed: 30~200 rpm, adjustable; Rotation direction: clockwise, counterclockwise
| Semi-automatic grinding and polishing machine
|
|
Rotor speed 50～500rpm；Rotation direction: counterclockwise
|
Noise level: polishing 54 dBA, grinding 54-69 dBA
|
Pressure control: 5N, single point force: 5~40N, sample size: 30mm
|
5
| Density Meter
| Weight: 0.005g~600g
| Weight, density, volume test of solids, particles, emulsions, etc.
|
|
Specific gravity accuracy: 0.001g/cm3
|
6
| Stereo Microscope | Magnification: 7~45X continuous zoom | Drawing, photography, dimension measurement
| Accredited |
LED light source: Adjustable light source
|
7
| Material Testing
| B-H Analyzer
| Test frequency: sine wave 10Hz~10MHz, power amplifier DC-3MHz, square wave (Duty50%, symmetrical) 10Hz~1MHz; thermostat scanning system 10Hz~5MHz
| B-H mode: Bm, Br, Hm, I1m, Hc, Br/Bm, μa, PC, Pcv, Pcm, θ, 2Φm, V2m
Pc mode: Pcv, Pcm, θ, μa, Bm, V2m, Br, Hm, Hc, Pc, VA, I1m
μmode: Bm, V2m, Hm, I1m, μa, L, R, |Z|, Pc, μ′, μ″, μz, tanδ, θ, Q, THD |
|
Frequency accuracy: less than ±2%; Distortion rate: ＜ 2%
|
Test accuracy: phase ± 0.15deg, amplitude: ± 2%, power loss: ± 5.6%
|
Max. input voltage: +/-200V； Max. input current: +/-6A
|
Thermostat scanning system: operating temperature-30℃～150℃, batch testing: 20pcs
|